All skills

Phase mapping from dispersive spectra with peak deconvolution and ZAF correction

Reference-free 2D classification of particle micrographs with a motion-correction pre-pass.

Core-loss edge identification and oxidation-state fingerprinting

Magnification calibration against certified cross-grating standards

Mill-volume segmentation and lift-out path planning for serial sectioning

Ice-thickness estimation and automated grid-square quality triage

Fiducial-free tilt-series alignment with confidence-weighted reconstruction

Bayesian d-spacing measurement and lattice fitting from HRSTEM images

3D surface relief reconstruction from four-quadrant backscattered stacks

Template-free particle picking tuned for low signal-to-noise micrographs

Closed-loop drift correction for long atomic-resolution acquisitions

Per-tilt CTF estimation and refinement with amorphous-carbon reference subtraction