Indexed skill registry
Skills for the electron microscope
A shop of ready-to-use SKILL.md packages for image acquisition, segmentation, and calibration across SEM, TEM, STEM, EDS, EELS and cryo-EM workflows — each one testable before you install it.
Browse by technique
taxonomy / 7Featured skills
view all →edax-phase-map
EDSMCP serverPhase mapping from dispersive spectra with peak deconvolution and ZAF correction
cryo2d-classify
cryo-EMMCP serverReference-free 2D classification of particle micrographs with a motion-correction pre-pass.
eels-edge-id
EELSMCP serverCore-loss edge identification and oxidation-state fingerprinting
scalebar-calibrate
SEMSKILL.mdMagnification calibration against certified cross-grating standards
Frequently asked
A portable, human-readable capability manifest paired with a runnable implementation, so an AI agent can discover and apply it to a microscope workflow.
Skills target the acquisition and analysis layer, not the vendor SDK. Adapters map to SEM, TEM, STEM, EDS, EELS, cryo-EM and FIB backends.
Yes. Submit a repository containing a valid SKILL.md; it enters the review queue and appears in the index once calibrated.